Oxford Instruments has announced the new X-Strata920 X-ray fluorescence (XRF) analyser for coating thickness measurement and materials analysis. It combines a large-area proportional detector and Oxford Instruments’ micro-focus X-ray tube, providing a high-intensity small spot X-ray beam for superior sample excitation. This combination guarantees the best accuracy in its class, with analysis results obtained in seconds to ensure better process control and cost efficiency.
So, whether you analyse solder alloys as part of your quality control process, assay gold jewellery for valuation or measure plating thickness in component manufacture, Oxford Instruments believes the X-Strata920 is an ideal solution for any business requiring reliable analysis at an affordable price.
X-Strata920 performs excellent analysis and characterisation of multi-layer components across a wide range of industrial markets, including electronics, metal finishing, alloys and precious metals assay. For these industries, the X-Strata920 offers a number of benefits:
- Increased productivity with better process control.
- Minimised production cost of the plating process and maximised production output.
- Rapid, non-destructive analysis of jewellery and other alloys.
- Rapid analysis of up to four coating layers.
- Field-proven technology and better reliability ensuring value for money year after year.
- Easy to use, with minimal user training required.
The X-Strata920 comes with a choice of calibration packages tailored for a wide range of materials screening applications; the analyser is supplied with over 800 pre-loaded, easy-to-select application parameters/methods.
To build consumer confidence, the X-Strata920 meets international test methods such as ASTM B568 and ISO 3497.
With its advanced security and safety features, the X-Strata920 provides a simple user interface for the routine operator whilst assuring manager-level access for system set-up and preventing unauthorised use through its auto-lock function. The improved reporting function allows seamless export to Excel within seconds and export in custom reports, including statistical data analysis and sampling images.