22-24 June 2010, Ettington Chase, Stratford-upon-Avon, England
CM 2010 and MFPT 2010 Monitoring and Machinery Failure Prevention
Technologies
Please follow the below link to download (in Doc) the CM2010 Programme.
http://www.bindt.org/downloads/CM2010Programmefinal.doc
Please follow the below link to download (in PDF) the call for papers for the CM2010 conference at the Ettington Chase, Stratford-upon-Avon, England on the 22-24 June.
http://www.bindt.org/downloads/CM2010CFP.pdf
About the International Conference
The British Institute of Non-Destructive Testing (BINDT) is pleased to invite you to this premier event, the Seventh International Conference on Condition Monitoring and Machinery Failure Prevention Technologies.
The Conference is being organised by BINDT in close co-operation and partnership with the US Society for Machinery Failure Prevention Technology (MFPT). The combination of the efforts of two leading organisations creates the largest event of its kind at a truly international level and builds on the highly successful series of international Condition Monitoring Conferences (CM2001, CM2003, CM2005, CM2007, CM2008 and CM2009) organised by BINDT and highly successful 63 Annual Conferences organised by the Society of MFPT.
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The programme will include:
- Plenary keynote addresses
- Plenary distinguished invited presentations
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Specialised keynote addresses (for structured session organisers)
- Invited presentations
- Contributed presentations, including case-study presentations
- World-leading sessions for major industrial sectors, including a session f or the BINDT certification scheme
- Expert panel sessions on hot topics in condition monitoring, organised by recognised scientists
- Extensive exhibition and vendor presentations
- Social events
- Poster presentations (subject to decision of the Local Organising Committee)
