CSEM
Stand 100
Established in 1984, CSEM will be using Materials Testing 2009 to market its range of X-ray technologies.
A highlight of the display will be a demonstration of the X-ray Talbot interferometer for phase contrast X-ray imaging, which enables users to take high resolution images of soft materials such as plastics, fibre-reinforced plastics, ceramics, paper, fruits, tissue and other organic materials.
Based in Switzerland, CSEM also specialises in R&D work in microtechnology, nanotechnology, photonics, microelectronics and system engineering.
www.csem.ch
