About the Organisers

10-12 October 2016, Novotel Paris Sud, Porte de Charenton, Paris, France 

Conference Organisers
The Conference is organised by the Condition Monitoring and Diagnostic Technology (COMADIT) group of the British Institute of Non-Destructive Testing, in close co-operation and partnership with the US Society for Machinery Failure Prevention Technology.

The British Institute of Non-Destructive Testing is the internationally-recognised focal point for CM and NDT. It is the professional institute for all those engaged in CM and NDT. It is concerned with education, training, certification and the advancement of the science and practice of the subjects.


About the Condition Monitoring Technical Committee 'COMADIT'
The Condition Monitoring Technical Committee, COMADIT, is the specialist group within BINDT promoting best practice and exchange of knowledge within the CM and diagnostic community worldwide. COMADIT aims to:
  • Provide a distinct forum within BINDT, which concerns itself with all aspects of CM.
  • Promote the development and application of CM technologies; propagate knowledge of CM methods through publications, seminars, conferences and training courses.
  • Establish national standards for personnel training and certification in the application of CM and diagnostic technology.

About MFPT

The US Society for Machinery Failure Prevention Technology (MFPT) is an interdisciplinary technical organisation strongly oriented toward practical applications. The MFPT Society acts as a focal point for technological developments that contribute to mechanical failure reduction or prevention.

Local Organising Committee

Prof L Gelman (Chair)
Cranfield University
Ms K Hickman BINDT
Mrs K Cambridge
Prof A Hope Southampton Solent University
Mr P Kolbe BINDT
Miss A Cooke BINDT
Mr C Pearson BSRIA / UKTA
Mrs S Purdy BINDT
Dr L Wang University of Southampton
Mr D Whittle RMS-Reliability
Mr S Greenfield Eaton Aerospace

International Scientific Advisory Committee

Prof L Gelman, UK

Honorary Co-Chair:
Dr M Farley, UK

Prof A Dunhill, UK
Prof S Heyns, South Africa
Prof R Smith, UK
Mr C Pomfret, USA
Mr C Sinclair, UK

Prof J Antoni, France Prof P John, UK Dr A Saxena, USA
Mr P Anuzis, UK Prof D Juricic, Slovenia Mr D Shorten, UK
Dr T Barszcz, Poland Dr E Juuso, Finland Prof R Smid, Czech Republic
Prof W Bartelmus, Poland Dr S King, UK Dr A Sokolova, Russia
Prof F Brennan, UK Dr R Klein, Israel Prof J Strackeljan, Germany
Dr F Chaari, Tunisia Prof V Kostyukov, Russia Prof L Swedrowski, Poland
Prof M Crocker, USA Prof U Kumar, Sweden Prof J Swider, Poland
Mr C Dibsdale, UK Prof L Kuravsky, Russia Prof R Tenne, Israel
Prof D Drikakis, UK Prof T Lago, USA Prof P Trampus, Hungary
Prof D Galar, Sweden Prof S Lahdelma, Finland Prof A Tsourdos, UK
Prof T-H Gan, UK Prof M Lipsett, Canada Prof T Uhl, Poland
Dr S Ganeriwala, USA Dr L Lobo, UK Prof J Vizintin, Slovenia
Mr D Gilbert, UK Prof A Lucifredi, Italy Prof V Volkovas, Lithuania
Mr S Greenfield Dr N Martin, France Prof N Vyas, India
Prof J Grum, Slovenia
Prof P Mazal, Czech Republic Mr R Wade, USA
Prof J Hammond, UK Dr A Mouzakitis, UK Dr M Walters, UK
Mr J Heigold, UK Dr B Murray, UK Dr L Wang, UK
Dr T Holroyd, UK Dr M Papaelias, UK Dr M Wasil, UK
Prof A Hope, UK Prof M Pawelczyk, Poland Mr D Whittle
Prof K Horoshenkov, UK Mr C Pearson, UK Dr G Yebra, UK
Mr K Innes, UK Prof S Radkowski, Poland Dr R Zimroz, Poland
Prof P Irving, UK Prof B Randall, Australia
Prof K Jackson, UK Prof J Rinkinen, Finland  
Prof I Jennions, UK Prof R Roy, UK  

For further information contact: The Conference Department, The British Institute of Non-Destructive Testing, Midsummer House, Riverside Way, Bedford Road, Northampton NN1 5NX, UK. Tel: +44 (0)1604 438300; Fax: +44 (0)1604 438301;
Email: karen.cambridge@bindt.org