About the organisers

Monday 14 to Friday 18 June 2021 

  Conference organisers
The conference is being organised by the British Institute of Non-Destructive Testing (BINDT) in close partnership with the International Society for Condition Monitoring (ISCM) and the US Society for Machinery Failure Prevention Technology (MFPT).

  About BINDT
BINDT is the internationally recognised focal point for CM and NDT and it is the professional institute for all those engaged in CM and NDT. It is concerned with education, training, certification and the advancement of the science and practice of the subjects.

  About the Condition Monitoring Technical Committee
The Condition Monitoring Technical Committee (CMTC) is the specialist committee within BINDT promoting best practice and exchange of knowledge within the CM and diagnostic technology (COMADIT) community worldwide.

  About ISCM
The International Society for Condition Monitoring (ISCM) is an international forum for individuals and organisations with an interest in CM. Its purpose is to bring together an international community with the common aim of achieving excellence in the development and practice of CM and related diagnostic technologies.

  About MFPT
The US Society for Machinery Failure Prevention Technology (MFPT) is an interdisciplinary technical organisation strongly oriented towards practical applications. The MFPT Society acts as a focal point for technological developments that contribute to mechanical failure reduction or prevention.

  Committees and members

Local Organising Committee
K Cambridge, BINDT
Professor A Hope
S Creed, BINDT
S McNally, BINDT
Professor L Gelman (Chair), University of Huddersfield
D Whittle, RMS Ltd
S Greenfield (Vice Chair), Eaton Aerospace
B Cutler (CMTC Chair)
International Scientific Advisory Committee
Professor L Gelman (Chair), UK
Dr S K Babu (Honorary Co-Chair), Singapore
Dr I Baillie (Vice-Chair), UK
S Greenfield (Vice-Chair), UK
Dr M Farley (Vice-Chair), UK Dr N Martin (Vice Chair), France
D Gilbert (Vice-Chair), UK
B Cutler (CMTC Chair)
Professor J Antoni, FranceProfessor M Lipsett, Canada 
Professor I Antoniadis, GreeceProfessor L Lobanov, Ukraine 
Professor S Ao, China Professor K Loparo, USA 
Dr D Arifianto, Indonesia Professor A Lucifredi, Italy 
Dr I Baillie, UKC Mackle, UK 
Professor A Ball, UKProfessor D Mikielewicz, Poland 
C Belinco, Argentina S Mills, UK 
Dr A Bereson, USA Dr S Muthuraman, UK 
Professor J Bortman, Israel Professor J Nieznański, Poland 
Dr S Boychenko, Russia Professor S Noroozi, UK 
Professor L Cheng, China Dr M Papaelias, UK 
Professor F Chu, China Professor F Pellicano, Italy
Dr P Cominetti, Italy Professor B Randall, Australia 
Professor M Crocker, USA Professor R B K N Rao, UK 
Professor G Dalpiaz, Italy Dr A Saxena, USA 
Professor M Deja, Poland D Shabalin, Denmark 
Dr J Dix, Denmark Professor G Shen, China 
Professor D Drikakis, UK D Shorten, UK 
Professor T-H Gan, UK Professor M Sidahmed, France 
Dr S Ganeriwala, USA Dr S Sieg-Zieba, France 
C Gerard, UK Professor R Smid, Czech Republic 
Dr F Gu, UK Professor A Starr, UK 
Dr G Herborg, Denmark Dr C Svendsen, Denmark 
Professor S Heyns, South Africa Professor L Swedrowski, Poland 
Professor A Hope, UK Professor P Trampus, Hungary 
Professor K Horoshenkov, UK Professor N Vyas, India 
Dr E Juuso, Finland Professor L Wang, UK 
Professor K Karwowski, Poland Professor P White, UK 
Professor A Khalid, UK D Whittle, UK 
Dr R Klein, Israel A Wynn, USA 
Dr S Kolokolnikov, Russia Dr G Yebra, UK 
Professor V Krylov, UK Professor R Zimroz, Poland 
Professor A Kumenko, Russia Professor M Zuo, Canada 
Professor L Kuravsky, Russia Dr G Zusman, USA 
Professor S Lahdelma, Finland 

For further information contact: Conferences and Events Department, The British Institute of Non-Destructive Testing,
Midsummer House, Riverside Way, Bedford Road, Northampton NN1 5NX, UK.
Tel: +44 (0)1604 438300; Fax: +44 (0)1604 438301; Email: cm_mfpt@bindt.org; Web: www.cm-mfpt.org