About the organisers

Monday 14 to Friday 18 June 2021 

  Conference organisers
The conference is being organised by the British Institute of Non-Destructive Testing (BINDT) in close partnership with the International Society for Condition Monitoring (ISCM) and the US Society for Machinery Failure Prevention Technology (MFPT).

  About BINDT
BINDT is the internationally recognised focal point for CM and NDT and it is the professional institute for all those engaged in CM and NDT. It is concerned with education, training, certification and the advancement of the science and practice of the subjects.

  About the Condition Monitoring Technical Committee
The Condition Monitoring Technical Committee (CMTC) is the specialist committee within BINDT promoting best practice and exchange of knowledge within the CM and diagnostic technology (COMADIT) community worldwide.

  About ISCM
The International Society for Condition Monitoring (ISCM) is an international forum for individuals and organisations with an interest in CM. Its purpose is to bring together an international community with the common aim of achieving excellence in the development and practice of CM and related diagnostic technologies.

  About MFPT
The US Society for Machinery Failure Prevention Technology (MFPT) is an interdisciplinary technical organisation strongly oriented towards practical applications. The MFPT Society acts as a focal point for technological developments that contribute to mechanical failure reduction or prevention.

  Committees and members
Local Organising Committee
K Cambridge, BINDT
Professor A Hope
S Creed, BINDT
S McNally, BINDT
Professor L Gelman (Chair), University of Huddersfield
D Whittle, RMS Ltd
S Greenfield (Vice Chair), Eaton Aerospace
B Cutler (CMTC Chair)
International Scientific Advisory Committee
Professor L Gelman (Chair), UK
Dr S K Babu (Honorary Co-Chair), Singapore
Dr I Baillie (Vice-Chair), UK
S Greenfield (Vice-Chair), UK
Dr M Farley (Vice-Chair), UK Dr N Martin (Vice Chair), France
D Gilbert (Vice-Chair), UK
B Cutler (CMTC Chair)
Dr A Angulo, UK
Professor S Lahdelma, Finland
Professor J Antoni, France
Professor P Lazaridis, UK
Professor I Antoniadis, Greece
Professor M Lipsett, Canada
Professor S Ao, China
Dr J Liska, Czech Republic
Professor R Babu, India
Professor K Loparo, USA
Professor A Ball, UK
Professor A Lucifredi, Italy
C Belinco, Argentina
C Mackle, UK
Professor J Bortman, Israel
Professor D Mikielewicz, Poland
Dr S Boychenko, Russia
S Mills, UK
Professor F Chaari Tunisia
Dr S Muthuraman, UK
Professor L Cheng, China
Professor J Nieznański, Poland
Professor F Chu, China
Professor S Noroozi, UK
Dr P Cominetti, Italy
Dr M Papaelias, UK
Professor M Crocker, USA
Dr M R Paurobally, Qatar
Professor G Dalpiaz, Italy
Professor F Pellicano, Italy
Professor A Darpe, India
Professor Z Peng, China
Professor M Deja, Poland
Professor B Randall, Australia
Professor D Drikakis, UK
Professor R B K N Rao, UK
Professor T-H Gan, UK
Professor R Serra, France
Dr S Ganeriwala, USA
Professor G Shen, China
C Gerard, UK
D Shorten, UK
Professor F Gu, UK
Professor N K Singh, India
Dr G Herborg, Denmark
Professor R Smid, Czech Republic
Professor S Heyns, South Africa
Professor A Starr, UK
Professor A Hope, UK
Dr C Svendsen, Denmark
P Johnson, USA
Professor L Swedrowski, Poland
Dr E Juuso, Finland
Professor N Vyas, India
Dr C Kar, Saudi Arabia
Professor L Wang, UK
Professor H Karimi, Italy
Professor P White, UK
Professor K Karwowski, Poland
D Whittle, UK
Professor A Khalid, UK
Dr G Yebra, UK
Dr R Klein, Israel
Professor S Zhong, China
Dr S Kolokolnikov, Russia
Professor R Zimroz, Poland
Professor A Kumenko, Russia
Professor M Zuo, Canada
Professor L Kuravsky, Russia
Dr G Zusman, USA

For further information contact: Conferences and Events Department, The British Institute of Non-Destructive Testing,
Midsummer House, Riverside Way, Bedford Road, Northampton NN1 5NX, UK.
Tel: +44 (0)1604 438300; Fax: +44 (0)1604 438301; Email: cm_mfpt@bindt.org; Web: www.cm-mfpt.org