Abstract and full paper submission
13-16 June 2017, ILEC Conference Centre, London, UK
To download the call for papers leaflet, click here.
The deadline for the submission for abstracts (of no more than 200 words) is 27 January 2017,
with the deadline for submitting full-length papers being 24 March 2017.
Abstracts and full papers should be submitted via the website: http://mc.manuscriptcentral.com/wccm2017
To submit an abstract, enter your Author Centre and then click on 'Click here to submit a new manuscript'. Follow the instructions to upload your abstract.
To submit your full paper, enter your Author Centre and then click on 'Manuscripts with Decisions'. You should see the title of your accepted abstract and next to it an option to 'Click here to submit a full paper'. Click on this link and follow the instructions to upload your full paper.
Copyright form, terms and conditions are available at the above website under 'Instructions and Forms'.
We encourage papers from both academia and industry on the following topics:
|Instrumentation and ITC for CM ||Design and manufacturing for CM and maintenance|
|Wireless techniques and systems for CM||Design and life-cycle integrity|
|Architecture of CM systems||Design for optimal maintainability|
|ITC for CM||Design improvement via CM|
|CM systems||Simulation models and software for optimal asset design and manufacturing|
|Hardware and software platforms for CM systems||Root cause analysis of faults/failures |
|High performance computing for CM systems||HAZOP|
|Robotics for CM||Fault tree analysis|
|Off-board and off-board CM systems||Root cause analysis methods: Ishikawa Diagram, 5 Whys, Eight Discipline Problem Solving, Scatter Diagrams, Is-Is not, etc|
|OSA-CBM for CM||Human and latent root causes of faults/failures|
|Integrated CM technologies and systems||Root cause analysis: case studies|
|Communication for CM||Sensors and actuators |
|Internet of things and services for CM||Standard sensors and actuators|
|Data storage and backup for CM||New and advanced intelligent sensors and actuators|
|Certification, education and training for CM ||Embedded sensors and embedded calculations in sensors and actuators|
|Engineering standards for CM||Sensor fusion|
|CM education, including CPD||Energy harvesting|
|CM training||Signal and image processing, pattern recognition, finite element modelling and simulation for CM |
|CM certification||Decision support for CM|
|Maintenance ||Data mining and fusion|
|Maintenance planning, scheduling and control||Optimisation in CM|
|Repair, replacement and overhaul||Linear, non-linear, time, frequency and time-frequency signal processing techniques for CM|
|Management of enterprise shutdown and overhauls||Signal processing techniques for machinery non-stationary conditions|
|Life-cycle cost benefit analysis for maintenance and CM||On-line and off-line adaptation of CM technologies|
|Failure effects and consequences||Feature extraction and pattern recognition for CM|
|Through-life support||Linear and non-linear finite element modelling for CM|
|Risk assessment and management||Linear and non-linear multi-freedom dynamical analysis of complex systems for CM|
|Risk based maintenance||Modal analysis for CM|
|Reliability centered maintenance and reliability improvement||Simulation of linear and non-linear complex systems for CM|
|Classical and advanced software for maintenance: CMMS, RCM++, ERP, etc||Computational methods for CM|
|Human errors in maintenance||Probabilistic and statistical methods for CM|
|Logistics and spare part management||Classical and novel image processing techniques for CM|
|Maintenance: case studies||CM methods and technologies |
|Asset management ||Equipment troubleshooting|
|Asset management systems||Methods for fault severity estimation|
|Asset management via CM||Future directions for CM|
|Optimal asset replacement||All CM methods and technologies:|
|Asset data bases||Vibration analysis|
|Improvement of asset safety via CM||AE|
|Structural health monitoring ||IRT|
|NDT methods and technologies ||Condition monitoring via machinery performance parameters|
|All NDT methods and technologies:||Strain/Stress analysis|
|Ultrasound||CM: case studies|
|IRT||Nano-Technologies for CM |
|Optical NDT||Materials characterisation|
|Fusion of CM/NDT methods and technologies|
|NDT: case studies|
|Damage, fault and failure |
|Failure assessment methods|
|Physics of failure, fault/failure modes|
|Fatigue and fracture|
|Prognostics for CM |
|Model driven prognostics|
|Data driven prognostics|
|Fatigue and fracture prediction|
|Models for fault propagation|
|Condition indicators for prognostics|
|Prognostics: case studies|
Other relevant topics are welcome. To download a copy of the subject breakdown, click here.
Papers that are submitted will be reviewed by an extensive programme panel, chaired by Professor Len Gelman, of Cranfield University (UK), and Professor Tony Hope, of Southampton Solent University. The accepted papers will be published in congress proceedings that will be available at the congress. The congress proceedings will be indexed by Web of Science, Scopus and other appropriate citation databases. The congress requires that at least one of the authors of each accepted paper must register for the congress, otherwise the paper will not be included in the congress proceedings.
The accepted papers will be considered for publication in the BINDT international journals Insight and the International Journal of Condition Monitoring. Papers related to ‘case studies’ will be considered for publication in the BINDT international newsletter Condition Monitor. With English being the congress language, the contributions must be submitted and presented in English. Translation into other languages will not be provided.
The British Institute of Non-Destructive Testing, Midsummer House, Riverside Way, Bedford Road, Northampton NN1 5NX, UK.
Tel: +44 (0)1604 438300; Fax: +44 (0)1604 438301; Email: email@example.com