Integral TOFD probe
22/01/2020
GB Inspection Systems Ltd has announced the introduction of a unique and patent-pending integral time-of-flight diffraction (TOFD) probe.This probe has been developed with the purpose of acting as an alternative to the older, traditional TOFD wedge and transducer offerings. The cost-effective integral TOFD probe solution provides unique benefits, such as consistent sensitivity, with less chance of inconsistencies between the transducer and wedge pairing. The wedge and probe cannot be unscrewed during scanning, making them more robust as there is no mechanical fixing of the wedge and transducer required, which eliminates the risk of breakage.
Additional benefits of the integral TOFD probe are its plug-and-play operation, making it easier to deploy in comparison to traditional transducer and wedge arrangements, the fewer requirements for preamplifiers, the improved signal-to-noise characteristics in comparison with conventional transducer and wedge arrangements and the availability of the probe in a variety of angles, frequencies and crystal sizes.
Extra options are available for bespoke uses, such as axial and circumferential contouring and bespoke angles. Connectors are available to order and integral cable versions are available if required. The integral TOFD probe will fit all available scanners and comes with couplant feed inputs as standard.It is claimed that pricing is around 60% more affordable than the older, separate probe wedge types.
www.gbinspection.com
