M2M to display latest GEKKO at Materials Testing 2017
07/09/2017
M2M will be attending the next Materials Testing exhibition to market its range of phased array
ultrasound equipment for non-destructive testing. A highlight of the display will be the flaw detector GEKKO 2.0, which improves productivity and ergonomics while keeping up with innovations in phased array ultrasonic testing (PAUT) and the total focusing method (TFM).GEKKO 2.0 also releases hardware and software features requested by NDT inspectors, such as a clickable scroll wheel to complement the touchscreen or a more sensitive and multi-touchscreen for better usage, even under the harshest conditions of inspection. With this new release, standard time-corrected gain (TCG) calibration features are also available with TFM.
Already available in previous GEKKO versions, the real-time TFM imaging enables operators to have unparalleled resolution detection and characterisation for larger zone coverage, as well as for greater tolerance to probe positioning. TFM is implemented on GEKKO for circumferential and longitudinal welds and flange and bolt configurations to ease the diagnosis of the inspection. The TFM eases and shortens the NDT inspector’s time in the field.
All techniques implemented on GEKKO are made compatible with the industry’s most popular probes and scanners (including three-axis scanners encoding and imaging the probe skewing), allowing a step up in performance without having to replace the in-house inventory of equipment. Service companies also use GEKKO for high-resolution corrosion mapping, the detection and characterisation of early stages of high-temperature hydrogen attack (HTHA), as well as hydrogen-induced cracking (HIC) and stress-orientated hydrogen-induced cracking (SOHIC) defects.
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