Ultra-portable eddy current flaw detector
04/08/2026
ETher NDE has announced the release of PockET, a next-generation single-channel eddy current flaw detector designed to deliver exceptional inspection performance in a compact, pocket-sized form. Combining advanced eddy current capability with true portability, PockET allows technicians to perform professional-grade inspections anywhere, without the bulk and weight of traditional instruments.Weighing just 321 g, the PockET is ultra-lightweight and slips easily into your pocket or on-site kit bag, making it ideal for field inspections, confined spaces and rapid on-site assessments. Despite its small size, PockET delivers the power, accuracy and reliability expected from the ETher NDE range of instruments.
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PockET brings together high-resolution signals, fast scanning responsiveness and a bright, easy-to-read display. Whether performing surface crack detection or subsurface flaw identification, PockET provides clear, stable indications suitable for aerospace, manufacturing, power generation, automotive, rail and general engineering applications.
Its rugged, field-ready construction is built to withstand daily use in industrial environments.
The high-resolution display provides clear signal representation for confident interpretation and the PockET supports absolute, bridge and reflection probes, offering wide versatility for surface and subsurface flaw detection.
The long battery life of over 12 hours’ runtime ensures uninterrupted inspections over a full shift and a quick six-hour recharge means the unit is ready for the next day with a fast turnaround.
Optional ETherCover extended warranty adds up to five years of support, including free annual calibration.
ETher NDE
www.ethernde.com
