Travel and attendance award

Tuesday 12 to Thursday 14 September 2023
Northampton Town Centre Hotel, Northampton, UK 



  Background
The aim of this award is to encourage the attendance at the BINDT annual conferences by contributors from overseas nations. The target group for this award is individuals from the profession of non-destructive testing (NDT) and condition monitoring (CM) who wish to attend the conferences but are unable to do so due to financial constraints. Applicants can range from individuals at an early career stage or be experienced contributors who are unable to attend because of restricted finance. The title of the award will be ‘The Conference Travel and Attendance Award’.

  Key principles
  • The award is expected to be available annually for attendance at the NDT and CM conferences to present a paper of interest to the relevant community.
  • The award will consist of a contribution towards travel, subsistence and conference fees. The amount will be typically up to £750.00 and the recipient will also receive free full-time conference registration, which includes all sessions, lunches and evening functions at the conference.
  • The recipient will be asked to provide feedback to the Institute indicating benefits or problems to ensure that future awards meet the objectives of the Institute.
  • It is anticipated that one award will be available annually for each conference.
  Financial arrangements
  • The Institute has allocated a fund from which these awards will be made.
  • If the costs exceed the limit of the award (expected to be a maximum of £750.00 plus a free full-time registration) the recipient must obtain the remaining funds from other bodies.
  • The magnitude of the financial part of the award will not be publicised. The recipient's name and employer will be publicised at the conferences because they are both relevant to the award.
  • The award will be paid after the conference on the presentation of suitable receipts directly to Karen Cambridge, Head of Events and Awards.
  • If no suitable applicant is identified the award will be held over for subsequent years.
  Judging panels
  • The judging panels will consist of five members (with expertise in NDT and CM, respectively) for each conference who are appointed by the Council of the Institute. Normally they will comprise the chairpersons (or other representatives) of the main committees (NDT and CM Technical Committees, Trade and Industry Executive Committee, Membership, Qualification and Education Committee (MQ&E) and the Certification Management Committee (CMC)).

  Eligibility criteria
  • Applicants should be permanent residents of an overseas nation.
  • Recipients must have had a paper accepted for presentation at the relevant conference that they wish to attend, at which point they will be asked to submit an application form.
  • Recipients must have demonstrated that conference attendance will make a strong contribution to their professional activities and be supported by referees, typically their managers or senior colleagues.
  • Recipients must supply a description of the financial limitations that the award is intended to overcome.
  Judging criteria
This award is intended to enhance the conference by allowing contributions from someone who would not otherwise be able to attend. The selection process must consider the following aspects for each applicant:

Technical content of the paper – the criterion here is the value to the other conference delegates in having the author present their work. The award will be made mainly on the basis of the quality of the written paper, rather than on the quality of the oral presentation. This will allow the judging process to be completed before the conference. However, a check will be made by members of the NDT and CM Technical Committees to ensure that the quality of the oral presentation of the proposed winner is acceptable.

Professional development – the criterion for this aspect of the award is the extent to which attendance will contribute to the professional development of the applicant in the fields of NDT and CM.

Limited finances – the key criterion will be the description of the limitation on funds available balanced against the benefits of attendance.

The judging panel may take other factors into account in reaching their decision.

  Award schedule
The Institute is able to offer an award, to support speakers from outside the UK with the cost of attendance. The award is aimed at individuals who will make a significant contribution to the conference by submitting a full paper and attending the conference to present the paper but may be restrained from attending due to limited finance. To apply for this award please submit an abstract and upon approval you will be sent an application form to complete. Alternatively, please request an application form from karen.cambridge@bindt.org and, provided the paper is accepted for presentation, ensure the completed form is returned with the necessary supporting documents by 31 March 2023. The successful applicant will be notified by 2 June 2023.
  • Applicants must request an application form. The deadline for receipt of completed forms for an award will be 31 March 2023. This allows for time to judge any applications received before travel arrangements need to be made.
  • The judging panel will review any applications and issue an offer letter to the successful candidate.
  • Unsuccessful applicants to be informed by 2 June 2023.
  • The recipient will need to claim award via submission of receipts for legitimate expenses, along with a feedback report. The deadline for this is 6 October 2023.
  • The NDT and CM Technical Committees will assess the feedback report and award process to verify it meets the objectives.
To download the CM Conference Travel and Attendance Award application form, click here.

  Contact details
Please send all information to:

Karen Cambridge
Head of Events and Awards
karen.cambridge@bindt.org

The British Institute of Non-Destructive Testing
Midsummer House
Riverside Way
Bedford Road
Northampton
NN1 5NX

  Written application
Elements to be included in the written application:
  • Applicant's details and contact details
  • Date
  • Affiliated organisation
  • Title of paper accepted for presentation
  • Referees (two preferred)
  • Justification for award (max 250 words)
  • Comment by Manager/Supervisor.

For further information contact: Events and Awards Department, The British Institute of Non-Destructive Testing,
Midsummer House, Riverside Way, Bedford Road, Northampton NN1 5NX, UK.
Tel: +44 (0)1604 438300; Email: cm_mfpt@bindt.org; Web: www.cm-mfpt.org