Showcase day
Tuesday 9 to Thursday 11 September 2025
Edinburgh International Conference Centre (EICC), UK
The Annual British Conference on Non-Destructive Testing (NDT) is a prestigious event where experts in NDT and related technologies meet to share experiences, ideas and the very latest developments that will help shape the future of NDT.
There will be three parallel technical sessions covering a broad range of NDT technologies and applications. This will see experts in NDT meet to exchange experiences, ideas and the very latest developments that will shape the future of NDT.
The 21st International Conference on Condition Monitoring and Asset Management (CM 2025) will be co-located with NDT 2025 to celebrate the62nd Annual British Conference on NDT, which will allow delegates to
customise their experience by visiting both events under one roof.
To view the full NDT 2025 and CM 2025 programme, click here.
| Showcase Day |
BINDT will be hosting a ‘Showcase Day’ on the last day, Thursday 11 September,
focusing on NDT, CM and SHM future technologies.
The Showcase Day will provide ample time for visitors to explore all exhibits with demonstrations and plenary talks explaining the future techniques of NDT, CM and SHM. This event will offer engaging activities to inspire the next generation to consider the possible pathways into a career in these fields. The Showcase Day will also include:
- Lunch and awards ceremony
- Demonstrations: drones and robots
Attendance at the Showcase Day is FREE of charge to visitors. To pre-register, click here. Pre-registration must be completed to access the CM 2025 and NDT 2025 free-to-attend events.
(FREE attendance at the Showcase Day includes access to exhibits, demonstrations and presentations as listed in the programme below. Lunch is not provided.)
| Showcase Day Programme – Thursday 11 September 2025 | |||
| NDT Session A – Horizon scans of leading-edge NDE, CM and SHM technologies Chair: D Gilbert Room A – Sidlaw Auditorium | NDT Session B – Miscellaneous techniques Chair: J Watson Room B – Harris 1 | NDT Session C – Pathway to NDT Chair: S Cunningham Room C – Harris 2 | |
| 10.00-10.20 | [5A1] Emerging technologies and methodologies at the forefront of NDE B Drinkwater University of Bristol, UK | [5B1] Diamond quantum sensors for non-destructive testing B Vindolet, G Bourcin, H Nguyen and T Hingant KWAN-TEK, France | [5C1] Driving technical competence through structured training in Scotland K Fleming ECITB, UK |
| 10.20-10.40 | [5A2] Predicting the trends for condition monitoring D Manning-Ohren Eriks Industrial Services, UK | [5B2] A portable magnetic Barkhausen noise (MBN) instrument for hardness and stress evaluation X Pang, S She, X Zheng, X Zou, A Peyton and W Yin University of Manchester, UK | [5C2] Employer case study: bringing new people into the industry – training, development and mentoring M Byrne CAN Group, UK |
| 10.40-11.00 | [5A3] Research trajectories, critical challenges and opportunities that will shape the future of SHM S G Pierce University of Strathclyde, UK | [5B3] Hemispherical multi-directional eddy current array sensor for robotic profiling of metallic edge surfaces X Bai, F Zhu, Z Xia, A Peyton and W Yin University of Manchester, UK | [5C3] BINDT STEM and outreach programme R Mulholland BINDT, UK |
| 11.00-11.20 | [5A4] Using AI to cover the blind spot in NDT T Wenzel The German Society for Non-Destructive Testing (DGZfP), Germany | [5B4] The use of muon tomography for structural integrity and ground remediation and characterisation L Thompson and C Steer Geoptic Infrastructure Investigations Ltd, UK | Q&A Session S Cunningham, Lavender International, UK, K Fleming, ECITB, UK, M Byrne, CAN Group, UK, and R Mulholland, BINDT, UK |
| 11.20-15.30 | Showcase of exhibits of future technologies – Lomond Suite Demonstration stands:
| ||
| 11.30-12.00 | CM Plenary Paper: Fault diagnostics and prognostics of power transmission train of rotating machinery Professor T R Lin and Y Shang, Qingdao University of Technology, China Chair: Professor L Gelman, University of Huddersfield, UK Room D – Carrick 2 and 3 | ||
| 12.00-12.30 | CM Panel Session – Future directions in condition monitoring Chair: Professor L Gelman, University of Huddersfield, UK Room D – Carrick 2 and 3 | ||
| 12.30-13.30 | Lunch and Showcase of exhibits of future technologies – Lomond Suite Demonstration stands:
The Len Gelman Best Paper Award for CM The William Gardner Best Paper Award for NDT | ||
| 13.30-14.30 | Panel Session – CM, NDE and SHM – Lomond Suite B Drinkwater, University of Bristol, UK D Manning-Ohren, Eriks Industrial Services, UK S G Pierce, University of Strathclyde, UK T Wenzel, The German Society for Non-Destructive Testing (DGZfP), Germany Panel Session – Audience with D Gilbert and guests | ||
| 14.30-15.30 | Tea, Coffee, Scottish shortbread and Showcase of exhibits of future technologies – Lomond Suite Demonstration stands:
| ||
| 15.30 | Conference close – Lomond Suite | ||
For further information contact: Events and Awards Department, The British Institute of Non-Destructive Testing,
Midsummer House, Riverside Way, Bedford Road, Northampton NN1 5NX, UK.
Tel: +44 (0)1604 438300; Email: conf@bindt.org; Web: www.cm-mfpt.org
