Series: The Capabilities and Limitations of NDT Part 5. UT Testing Special Techniques

INST109

Series: The Capabilities and Limitations of NDT Part 5. UT Testing Special Techniques
Author:
Dr M G Silk
Publisher:
The British Institute of Non-Destructive Testing
Volume:
1
Binding:
1988. 31 pp. A5. Soft cover.
ISBN:
0 903 132 109
There has been considerable research and development on the improvement of accuracy of ultrasonic techniques and the development of more accurate techniques. As a result, the accuracy and reliability of ultrasonic defect location and sizing in particular, have been improved substantially for the majority of inspection tasks. This booklet describes some of the results of these developments in ultrasonics. It covers holography, SAFT and deconvolution and, in the section devoted to the determination of defect height, introduces the Time-of-Flight Diffraction (TOFD) technique. There are sections on reliable ultrasonic defect detection, monitoring crack growth using tip diffraction techniques, defect characterisation, the inspection of difficult materials, measurement of material texture, stress measurement, and the current situation and future prospects for ultrasonics.

Price: £7.00

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