New advanced UT software course
09/05/2018
In addition to the new data analysis certification courses for phased array (PA) ultrasonic testing (PAUT) and time-of-flight diffraction (TOFD), TWI is launching a new non-certification course for advanced UT software. Following the high demand for phased array courses in recent years, many inspectors are now familiar with the basic functions of the existing analysis software developed by major original equipment manufacturers (OEMs). However, during a standard phased array training course, the focus is on the capability of students to analyse PA data rather than being dexterous in using the software. In addition, the certification exam following a standard course puts pressure on candidates to focus on the core competencies being assessed.
The key competencies of the course aim at data file management, file merging and stitching, creation of custom layouts, using multiple PA views and groups, driving PA units through the software where applicable, ray tracing aspects, software functionality, sizing tools and reporting. All participants are provided with a laptop, a software license key and a CD with PAUT and TOFD data files from different applications. The course ends with a half-day competency test leading to a TWI Advanced UT Software attendance certificate.
The software packages supported in this course are Olympus TomoView, Zetec UltraVision, Sonatest UT Studio and M2M Enlight. Participants can choose any of these options depending on the PA instrument they use or the software they usually employ for data analysis. Additionally, participants will have an insight into all of the different pieces of software available on the course.
The benefits to industry, which drove the development of this course, include an increased probability of detection, increased productivity, high-quality reporting meeting industry requirements and a broader acceptance of this highly beneficial but complex inspection method.
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