Outstanding success of international metrology conference and exhibition
16/06/2011
Olympus attended the recent International Conference on Metrology and Properties of Engineering Surfaces, where it displayed its advanced measuring confocal laser scanning microscope, the LEXT OLS4000.Hosted by the National Physical Laboratory (NPL), the event was highly successful with a record number of delegates in attendance. With a focus on surface metrology, surface characterisation instrumentation and properties of engineering surfaces, the conference provided an effective forum to discuss the challenges and issues of metrology in practice. By raising awareness of the need to establish calibration standards, users can effectively identify and reject doubtful observations, thus increasing the accuracy of resulting data.
As the 13th iteration of this international conference, the meeting has developed into a well-recognised assembly of experts within the field of metrology. The event proved to be highly educational and informative, with speakers discussing ways to improve measurement technologies and increase the accuracy of resulting data. Dr Chris Brown from the Surface Metrology Laboratory, Worcester Polytechnic Institute, USA, discussed his work on spike filtering and filling, which is intended to improve the quality of texture measurements.
The presence of anomalous height readings can alter the assessment of surface quality assurance and obscure correlations, decreasing or eliminating the ability to discriminate between different surfaces. Because these spikes do not always reappear in the same location, his group has used the Olympus LEXT OLS4000 to obtain multiple measurements, which can be used to replace the heights at the locations where spikes have been removed.
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