Defect characterisation using multi-view TFM imaging algorithm
N Budyn, R L T Bevan, A J Croxford and P D Wilcox
Defect characterisation is an essential step of non-destructive testing, which aims to determine the shape and the size of a defect once detected. The characterisation of small defects remains difficult because their shape may not be resolved using imaging algorithms. This work introduces a probabilistic characterisation method based on multi-view total focusing method (TFM) and an ultrasonic forward model. The measured intensities of the defect in the images act as a signature, which is compared against a database of reference defects. Using Bayesian inference, the reference defects that most credibly explain the measured signature are retrieved.
